OSP – M470.
A technique for the M470 workstation
The Optical Surface Profiler option of Bio-Logic’s modular M470 scanning electrochemical workstation.
The Optical Surface Profiler option of BioLogic’s modular M470 scanning electrochemical workstation.
The Optical Surface Profiler (OSP) is a non-contact topography technique. In OSP light, specifically for the OSP470 a laser light is used to detect the height changes of a surface. Height changes of less than 1 µm to 10 mm are detectable using the OSP470. The OSP470 has been designed for use with the other modules available on the M470 system. The combination of the OSP measurement with other techniques is made easier by the ability to co-mount the OSP470 head with any of the electrochemical probes of the M470. Furthermore, the data measured from an OSP measurement can be used to perform constant distance measurements of the other techniques on the M470.
OSP can be used to determine the topography of any sample of interest. In material measurements, the M470 software can be used to determine the surface roughness parameters of a sample measured in an OSP experiment. When used in corrosion studies it can determine the topography of pitted samples, or allow coating thicknesses to be measured. In other fields such as sensor studies, OSP can be used to determine the height profile of the sample for use in constant height measurements.
Overview: An easy to set up, fast, non-destructive topography technique
- Fast: Area scans of >10,000 points measurable in minutes
- Non-destructive: There is no physical contact with the sample.
- Can be paired with other techniques
Fast, non-destructive topography technique
The OSP470 module provides the fastest topography measurement available on the M470 system. The use of the laser light to measure topography means the OSP measurement can be performed almost exclusively at high speeds in the sweep scan mode. In this way, full area scans of >10,000 data points can be measured in minutes. Just as important OSP is completely non-destructive with no physical contact made at any point during the measurement.
Can be used as the topography input for all M470 height tracking measurements
Many scanning probe electrochemistry techniques are distance-dependent. Therefore, for rough samples, or for samples with background tilt it can be difficult to maintain the strongest signal throughout the scan. One way to ensure the highest sensitivity throughout these scans is to perform a constant distance measurement using the height tracking capability. The area scans measured in OSP can be used in any height tracking measurement on the M470. This means users can quickly determine the topography of their sample in a non-destructive manner prior to making their electrochemical measurement of interest.
The Scanning Electrochemical Workstation software provides unique capabilities and interactivity in support of the Model 370 and Model 470 nanometer-resolution scanning probe microscopes. This highly ergonomic software has been designed to facilitate and improve the user experience and render workflows more efficient:
- Improved data analysis, manipulation and interactivity
- Automatic measurement and sequencing functionalities.
Over 40 discrete experiments provided throughout, each with their own individual variations
M470 Scanning Electrochemical Workstation Software
MIRA: Microscopic Image Rapid Analysis
|Scan Range (x,y,z)||110 mm x 110 mm x 110 mm|
|Minimal Step Size (x,y,z)||20 nm|
|Positioning||Closed loop positioning, linear, zero hysteresis encoder with direct real-time readout of displacement in x, y, z|
|Linear position encoder resolution||20 nm|
|Max Scan Speed||10 mm/s|
|Measurement Resolution||32-bit decoder @ up to 40 MHz|
|Dimensions||500 mm (H) x 400 mm (W) x 675 mm (D)|
|Measurement Range||10 mm|
|Reference Distance||30 mm|
|Maximum Vertical Resolution (Static)||100 nm|
|Spot Size||30 µm at focus|
|Maximum Scan Speed||10 mm/s|
|Multiple Readings Averaged||Yes|
|Correct Positioning||Red Light/ Green Light|
|Light Source||650 nm class 2 semiconductor laser max. 0.95 mW|
|Available Experiments||Line Scan, Area Scan|
Electrochemistry Instrument catalog
SCAN-Lab Technical Notes 20 : Using SVET to measure Vertical Samples (log in to your account to view)
How do I use the M470?
Connection of 3300 potentiostats to the cell
Connection of SP-300 potentiostats to the cell
Setting up the probe & building the MicroTriCell
Experimental conditions and set-up
Approach experiment on resin (insulator)
Approach experiment on Gold (conductor)
Line Scan and Area Scan
Is there any analysis software available for use with the M470?
What application areas can I use the M470 for?
- SECM for bio-sensors
- Application of local electrochemical probes for coatings studies
- Application of local electrochemical probes for corrosion studies
- Application of local electrochemical probes for energy studies
- Application of scanning probe electrochemistry for biological studies
I see you supply 1 µm probes. Can I use these with the M470?
The following application note relates to 1 µm probes
Can I perform constant distance measurements?
The following application notes relate to distance measurements…
AN#1 – Height tracking with the SKP370 or SKP470 module
AN#2 – SECM height relief with OSP: An application in corrosion
AN#3 – SECM height relief with OSP: an application in sensors
AN#6 – Advantages of the intermittent contact SECM: two examples in corrosion
AN#11 – Measurement of a nano-patterned gold sample by ic-/ac-SECM
AN#13 – Investigation of an interdigitated array electrode using ic-SECM
AN#16 – Intermittent Contact (ic) SECM for relief of major topographic features
TN#14 – Height Tracking Inputs for SKP Investigations