Scanning Probe Electrochemistry & BioLogic

Scanning probe electrochemistry encompasses a range of scientific techniques combining both electrochemistry and microscopy. Bulk electrochemistry allows the investigation of global processes; however, it does not necessarily indicate the cause of such bulk processes. Conversely, with microscopy, surface features can be measured, but the effect of these features is not clear. Scanning probe electrochemistry  gives users a “best of both worlds” approach locally mapping the electrochemistry of a sample. Through scanning probe electrochemistry, a correlation between activity and features can be made. Scanning probe electrochemistry includes:


  • Scanning Electrochemical Microscopy (SECM)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Vibrating Electrode Technique (SVET) (also known as vibrating probe)
  • Scanning Kelvin Probe (SKP)
  • Scanning Droplet Cell (SDC)


BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.

Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in:


  • Corrosion and coatings
  • Biology, including biosensors and biotechnology
  • Batteries, fuel cells and photovoltaics
  • Materials
  • Catalysis

Venn diagram illustrating the different sample characteristics of techniques for the M470



BioLogic’s M470 Scanning Electrochemical Workstation gives users the highest level of flexibility available in scanning probe electrochemistry. There are 9 different techniques available on this fully modular instrument which can be included at point of purchase or added as the researcher’s needs grow. The wide range of cells and probes available for the M470 ensure that the instrument can be constantly tailored to meet experimental needs. The M470 is the only commercial instrument offering Intermittent Contact-SECM (ic-SECM) for constant distance SECM measurements. In this latest generation of scanning probe workstation all of the necessary electronics are contained within a single control unit, taking up the smallest possible amount of space.