Product support 5 min read

M470 Scanning Electrochemical Workstation Software

The Scanning Electrochemical Workstation software provides unique capabilities and interactivity in support of the  Model 470 nanometer-resolution scanning probe microscope. This highly ergonomic software has been designed to facilitate and improve the user experience and to improve the efficiency of workflows:

• Improved data analysis, manipulation and interactivity
•  Automatic measurement and sequencing functionalities.

Over 40 discrete experiments provided throughout, each with their own individual variations such as:

• Height-Tracking (above surface)
• Surface-Tracking (on surface)
• Step Scan
• Sweep Scan
• Pre-Delays, Line-Delays, Velocities, Step Sizes, Scan Dimensions, Signal Conditioning Parameters, Control Loop Parameters, Potentiostat Setting etc.

The Software provides both 64 bit Windows^TM support in a standard Multiple Document Interface (MDI) application that supports all standard Windows^TM features.

The Software is completely self-contained in a single application and contains:

• Experiment Sequencing.
• Multiple views of the same data presented in different formats or presentations.
• User-definable presentations of the data through a simple template-design tool.
• Fully programmable macro language for non-standard experiments.
• Relieve sample topography in area maps using “Height Tracking” from any topography data source: CHM, CTM, OSP, and ic-SECM.
• Direct real-time readout of displacement in x, y and z.
• Surface maps acquired at up to 70,000 data points in each axis.
• Simultaneous acquisition of multiple parameters at each point; 1 scan = many maps.
• Up to 12 different area maps populated simultaneously in a single scan, with 4 additional maps reserved for users’ data analysis.
• Application preferences for current convention.
• Application preferences for graph visuals.

Analysis

2D & 3D analysis tools