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SCAN-Lab Technical Notes 12: ac-SECM and LEIS: differences and similarities

Latest updated: May 18, 2021


Alternating Current  Scanning Electrochemical Microscopy (ac-SECM) and Localized Electrochemical Impedance Spectroscopy (LEIS) both allow local impedance information from a sample to be measured. This technical note explains the advantages and drawbacks of the two scanning impedance techniques that are offered in the M470: ac-SECM (offered with dc-SECM) and LEIS.

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SCAN Lab TN12 ac SECM and LEIS differences and similarities

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