CESH-e (Controlled Environment Sample Holder)

A leak-tight sample holder for controlled atmosphere study

The Controlled Environment Sample Holder is a leak-tight (up to 2 bar relative) sample holder for the electrical characterization of hard, powdered, pasty and soft materials. Oxygen and moisture sensitive samples can be prepared in a glove box and then placed inside the CESH-e. The CESH-e can be used as standalone, or inside an ITS-e or a climate chamber.

The CESH-e is often used in conjunction with the ITS-e Temperature Chamber. For more details, please click here.

Constant contact pressure and thickness measurement

A thickness measurement kit including a micrometer head with a calibrated ratchet is provided as an option to ensure the accurate measurement of the thickness of the sample (ASTM D374). This also enables reproducible pressure (100 N or 6 N respectively) to study flexible and compressible materials.

Applications

• Electrical Impedance spectroscopy
• Dielectric constant / dielectric loss
• In-plane and through-plane electrical measurement

 
Thanks to its modular electrodes setup, the CESH-e allows Through-plane and In-plane electrical measurements using interchangeable electrodes. For through-plane measurements the CESH-e can be configured in two ways: an unguarded electrode setup for routine measurement and a guarded electrode setup for conductivity measurements in compliance with ASTM D257 standard and accurate dielectric measurements as per the ASTM D-150 standard.

(Left) In-plane / (Right) Trough-plane

In-plane		Through plane
10 mm	097-150/IPSD (standard)	20 mm diameter	097-150/TP20
250 µm	097-150/IP250	1/2″ diameter	097-150/TP12
100 µm	097-150/IP100	1/4″ diameter	097-150/TP06

Specifications

• Operating temperature range – 40 to 150 °C
• Core material: Anodized aluminum
• Electrode material: Gold plated copper
• Dimension D 79 x H 94 mm (121.90 clearance)
• Sample diameter up to 30 mm
• Sample thickness up to 4 mm
• Residual capacitance with 20mm diameter= 8 pF
• Weight 900 g