Sweep scan in Scanning Kelvin Probe (SKP) experiments – Scanning probes – Application Note 24

Scanning Kelvin Probe (SKP) measures the contact potential difference between a probe and sample, a value is directly related to the work function, and corrosion potential of a sample. Although of great use the applicability of SKP, like other scanning probe microscopies, can be limited by the time to perform a measurement. In this note a laser marked anodized aluminium sample is measured to demonstrate how sweep scan can be used to perform fast, high quality, measurements.

Video demonstration

Scanning Kelvin Probe can be used to determine variations in corrosion potential across a sample. In this video we demonstrate the use of the sweep scan mode on the SKP470 to perform fast, high quality SKP measurements of a laser marked anodized aluminium sample provided by Renthal Ltd (https://www.renthal.com/). Further information can be found in the related app note: AN #24: The use of sweep scan in Scanning Kelvin Probe (SKP) experiments.